EEE5408

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Mixed Signal IC Testing I

Long Description (Course Description)

Fundamentals of Testing IC Devices and systems: test specifications, parametric testing, measurement accuracy, test hardware, sampling theory, digital signal processing based testing, and calibrations. Circuit analysis and design with analog and mixed-signal systems. Labs on testing passive components, LDOs, Op-amps, DACS/ADCs, Mixed-Signal ICs Labview and the National Instruments Savage Tester.

Min Credits

3

Max Credits

3

Repeat for Credit

No

Total Credits Allowed

3

Grading Basis

GRD - Letter Grade